The Unit for Nanoscopic Characterization (UNC) provides the “eyes” that researchers need to identify and characterize the nanometric structures they have created. The UNC is headed by Dr. Inna Popov and has a support staff of skilled scientists, engineers, and technicians who provide solutions to problems of material characterization on the nanometer scale.

The instruments of the UNC include:
High resolution Transmission Electron Microscope (HR-TEM)
Cryogenic and Tomography Transmission Electron Microscope (Cryo-TEM)
High resolution Scanning Electron Microscope (HR-SEM)
Environmental SEM
Scanning Probe Microscope (SPM)
X-ray Photoelectron and Auger Spectrometer (XPS/ESCA)
X-ray Diffractometer (XRD)
Sample preparation tools